Advantest Announces New Versatile, High-Throughput Test Solution for NAND/Nonvolatile Flash Memory I (Shannon Davis/Solid State Technology)

Shannon Davis / Solid State Technology
Advantest Announces New Versatile, High-Throughput Test Solution for NAND/Nonvolatile Flash Memory I – Semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has introduced a new high-throughput memory tester for NAND flash devices that can perform functional testing of chips while delivering highly accurate timing, repeatability and failure detection. Advantest Announces New Versatile, High-Throughput Test Solution for NAND/Nonvolatile Flash Memory ICs was posted by …

Leave a Reply

Your email address will not be published. Required fields are marked *

Subscribe to our Newsletter